Desarrollo de un sistema de medición de ruido de baja frecuencia para caracterización de canales conductivos en dispositivos electrónicos.

Abstract

A low frequency electronic noise measurement system was developed for the characterization of conductive channels in electronic devices. As part of the methodology, the design steps of the system are described starting from a theoretical review about the particularities of electronic noise, emphasizing the electric models that describe the origin mechanisms of intrinsic low frequency noise in electronic devices, concepts which are used to establish the system hardware and software requirements. The system consists of four fundamental modules: analog card, digital card, communication interface and data acquisition system, whose operation and implementation steps are described in detail. The system has been evaluated by performing measurements in resistors and metal-oxide-semiconductor field effect transistors to verify that the results obtained are consistent with the theoretical revision of the electronic noise models and with simulations performed in Multisim 14.0 and corroborate their correct operation. The results indicate that the instrument has a minimum level of current spectral density close to 1 pA / sqrt (Hz) and 0.01 pA / sqrt (Hz) at 1mHz and 10mHz, respectively, and 1fA / sqrt (Hz) for frequencies starting from 100mHz, which is within the design considerations. By using this system it is possible to obtain information about defects in the conductive channels of electronic devices in a non-invasive way obtaining information to determine its long-term reliability.